May 05, 2024  
ARCHIVED 2014-2015 Undergraduate Catalog 
    
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ARCHIVED 2014-2015 Undergraduate Catalog [ARCHIVED CATALOG]

CMC 410 - Scanning Electron Microscopy

3.00 credit hours
Students learn through lecture, demonstration, and hands-on participation how to setup and operate SEM and EDS instruments, including low-vacuum and field-emission models. The final quarter of the course is devoted to student projects, where students are invited to analyze their own samples on a variety of SEM instruments: JEOL JSM-6460LV low vacuum SEM, JEOL JSM-6480LV low vacuum SEM, JEOL JSM-6301F field emission SEM, JEOL JXA-8900 combined EDS/WDS electron microprobe analyzer and JEOL JXA-8200 combined EDS/WDS electron microprobe analyzer. At the end of the course, students with no prior experience are able to align an SEM, obtain secondary electron (SE) and backscatter electron (BE) micrographs and perform EDS qualitative and quantitative analysis. Includes practicum.

Prerequisite(s): Admission into the CMC program.


Click here for the schedule of classes.