| |
May 05, 2024
|
|
|
|
|
ARCHIVED 2014-2015 Undergraduate Catalog [ARCHIVED CATALOG]
|
CMC 411 - Advanced Imaging Techniques for Scanning Electron Microscopy2.00 credit hours
This course is an advanced topics course and provides instruction and hands-on practice for getting the best possible SEM images, especially from difficult samples, or under challenging operating conditions. Signals and image generation, instrument operation, operating variables, image interpretation and applications of SEM are studied through lectures and hands-on activities. Advanced SEM imaging topics such as very high resolution imaging and low voltage imaging are covered. Includes practicum.
Prerequisite(s): Admission into the CMC program.
Click here for the schedule of classes.
|
|
