May 05, 2024  
ARCHIVED 2014-2015 Undergraduate Catalog 
    
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ARCHIVED 2014-2015 Undergraduate Catalog [ARCHIVED CATALOG]

CMC 420 - Transmission Electron Microscopy

2.00 credit hours
This course provides practical, hands-on learning for new and experiences operators, utilizing lectures, demonstrations and direct student participation, using a JEOL JEM-3010 300kV, LaB6 TEM. Two experienced TEM analysts act as instructors, tailoring discussions to suit individual skill levels and interests. The course provides a foundation for new TEM operators, and gives students the skills necessary to align a TEM, and select parameters for acquisition of images, EDS specra, and electron diffraction patterns. Students with prior experience learn how to better utilize the multiple analytical capabilities of the TEM for real-world materials characterization. Includes practicum.

Prerequisite(s): Admission into the CMC program.


Click here for the schedule of classes.